公司简介
Optikos是世界上最大的生产光学图像质量测量设备的公司。30多年来，已成为光学和光电检测领域公认的领导者。能够提供完整的从光学系统到系统级的测试标准的解决方案，成像范围从紫外到远红外。
产品列表
Lens Testing Equipment
OpTest® Bench
| LensCheck™ Instrument
|
Camera Testing Equipment
Meridian™ Production Camera Testing: Do More. Do it Better.
Designed for rapid customization, the Meridian product line offers a revolutionary hardware and software approach to production camera testing. It’s a flexible test tool kit that’s compact, cost-effective and easy to incorporate in your production line: the graphical user interface facilitates setup and selection of metrology parameters; and a library of functions easily into your testing software.
Print Meridian Datasheet – English
Print Meridian Datasheet – Chinese
I-SITE™: The Most Comprehensive Camera Test Suite Available
The I-SITE system is designed to provide measurements at multiple points in the signal processing chain for many types of camera systems. I-SITE can be expanded to accommodate multiple measurements and can be upgraded to incorporate additional modules as the user’s system requirements change. There are many options that may be employed; thus there is no single I-SITE setup. Sources, detectors, and intermediate optics may all be configured to your requirements, and several different analysis options are offered.
Ophthalmic Testing Equipment
SMI: Surface Measurement Instrument
 | Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces. |
From optics to metal tooling, the SMI measures radius of curvature, toric radii and axis, conic constant and surface irregularities. Full surface maps reveal shape errors to within fractions of a micron. The SMI compares the wavefront reflected from the surface to that expected from a perfect sphere. The surface deviation is expressed in the form of characteristic circular functions called the Zernike polynomials. Within seconds, the SMI can measure shape departures better than 0.1 μm and radius better than 3 μm.
Features
Non-contact
One-button operation
Conic constant & shape factor
0.1 μm surface map accuracy
Toric and aspheric measurements
Under 10 seconds cycle time
Zernike Polynomials
Small bench footprint
.28 and .42 NA objectives available in standard configuration
Specifications
| Diameter of test area | Configurable to R*2*NA, where: R= part radius, NA= Objective numeral aperture |
| Measurement ranges | Radius of curvature: Nominally to 50mm of scan range, 0-20mm convex / concave depending on specific part-nest |
| Accuracy* | < 0.003mm on radius of curvature, < 0.0001mm peak to valley for surface maps |
| Repeatability* (1σ) | < 0.0007mm (1σ ) on radius of curvature |
| Physical | H 33 cm x D 28 cm x D 22 cm (21 kg) |
SRS-10 Set of Spherical
This set of precision-fused silica standards is used for SMI calibration and validation. The set of six includes:
Rc = 6 mm concave
Rc = 6 mm convex
Rc = 7 mm concave
Rc = 7 mm convex
Rc = 8 mm concave
Rc = 8 mm convex
The set is supplied with certification of surface figure and radius of curvature.
